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[DV] Tie test_en_i to zero

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- test_en_i is a DFT feature that shouldn't be enabled for normal
  runtime testing
- Only really affects the clock gate in the design, but is needed for
  running tests with the latch-based register file

Signed-off-by: Tom Roberts <tomroberts@lowrisc.org>
This commit is contained in:
Tom Roberts 2020-05-26 11:30:00 +01:00 • committed by Tom Roberts
parent f26cc9bb58
commit 7e1852024a
1 changed files with 1 additions and 1 deletions
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2
dv/uvm/core_ibex/tb/core_ibex_tb_top.sv
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@ -60,7 +60,7 @@ module core_ibex_tb_top;
) dut (
.clk_i (clk ),
.rst_ni (rst_n ),
.test_en_i (1'b1 ),
.test_en_i (1'b0 ),
.hart_id_i (32'b0 ),
.boot_addr_i (`BOOT_ADDR ), // align with spike boot address
.irq_software_i (irq_vif.irq_software ),